MIL-PRF-20K

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MIL-PRF-20K, PERFORMANCE SPECIFICATION, PERFORMANCE SPECIFICATION CAPACITOR, FIXED, CERAMIC DIELECTRIC, (TEMPERATURE COMPENSATING), ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR (14 NOV 2003) [SUPERSEDING MIL-C-20G]., This specification covers the general requirements for established reliability (ER) and non-ER, temperature compensating, fixed capacitors for use primarily where compensation is necessary for circuit applications due to temperature changes, in bypass and coupling applications. Capacitors meeting the ER requirements specified herein have a failure rate level (FRL) ranging from 1.0 percent per 1,000 hours to 0.00l percent per 1,000 hours. These failure rate levels are established at a 90-percent confidence level based on the life test parameters specified and are maintained at a 10-percent producer's risk. An acceleration factor of 8:1 has been used to relate the life test data at 200 percent of rated voltage at the applicable high test temperature to the rated voltage at the applicable high test temperature. A part per million (ppm) quality system is used for documenting and reporting the average outgoing quality of ER capacitors supplied to this specification. Statistical process control (SPC) techniques are required in the manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification.

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【英文标准名称】:Semiconductordevices-Micro-electromechanicaldevices-Part12:BendingfatiguetestingmethodofthinfilmmaterialsusingresonantvibrationofMEMSstructures(IEC62047-12:2011);GermanversionEN62047-12:2011
【原文标准名称】:半导体器件.微电机器件.第12部分:使用MEMS结构共振的薄膜材料的弯曲疲劳测试方法(IEC62047-12-2011).德文版本EN62047-12-2011
【标准号】:EN62047-12-2011
【标准状态】:现行
【国别】:
【发布日期】:2012-06
【实施或试行日期】:
【发布单位】:欧洲标准学会(EN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:抗弯强度;定义(术语);电气工程;疲劳;疲劳极限;材料;微电子学;微系统工艺;共振;试样;半导体器件;系统工程;试验;测试装置;试验体系;薄膜工艺
【英文主题词】:Bendingstrength;Definitions;Electricalengineering;Fatigue;Fatiguelimit;Materials;Microelectronics;Microsystemtechniques;Resonance;Samples;Semiconductordevices;Systemengineering;Testing;Testingdevices;Testingsystem;Thin-filmtechnology
【摘要】:
【中国标准分类号】:L40
【国际标准分类号】:31_080_01;31_220_01
【页数】:31P;A4
【正文语种】:英语


【英文标准名称】:ElectricLamps-Tungsten-HalogenLampswithP28Basesand89mmLCL
【原文标准名称】:电灯.带P28型基座和89mmLCL的卤钨灯
【标准号】:ANSIC78.1500-2001
【标准状态】:作废
【国别】:美国
【发布日期】:2001
【实施或试行日期】:
【发布单位】:美国国家标准学会(US-ANSI)
【起草单位】:ANSI
【标准类型】:()
【标准水平】:()
【中文主题词】:名称与符号;尺寸;电灯;卤素灯;灯;物理性能;卤钨灯
【英文主题词】:Designations;Dimensions;Electriclamps;Halogenlamps;Lamps;Physicalproperties;Tungsten-halogenlamps
【摘要】:Thisstandarddefinesthedimensionallimitsandotherphysicalcharacteristicsrequiredtoensureinterchangeabilityandassistintheproperapplicationofaspecificcategoryoflamps.Thiscategoryistungsten-halogenlampswithP28basesand89mm(
【中国标准分类号】:K71
【国际标准分类号】:29_140_20
【页数】:
【正文语种】:英语