BS ISO 15632-2002 微光束分析.带半导体探测器的能量散射X射线光谱仪的仪器规范
作者:标准资料网
时间:2024-05-19 22:06:14
浏览:8403
来源:标准资料网
下载地址: 点击此处下载
【英文标准名称】:Microbeamanalysis-InstrumentalspecificationforenergydispersiveX-rayspectrometerswithsemiconductordetectors
【原文标准名称】:微光束分析.带半导体探测器的能量散射X射线光谱仪的仪器规范
【标准号】:BSISO15632-2002
【标准状态】:作废
【国别】:英国
【发布日期】:2002-12-19
【实施或试行日期】:2002-12-19
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体二极管;半导体探测器;电子束;微量分析;半导体器件;X射线光度法;分析方法;X射线光度计;测量仪器;定义
【英文主题词】:Analysismethods;Definition;Definitions;Electronbeams;Measuringinstruments;Microanalysis;Semiconductordetectors;Semiconductordevices;Semiconductordiodes;X-rayspectrometer;X-rayspectrometry
【摘要】:ThisInternationalStandarddefinesthemostimportantquantitiesthatcharacterizeanenergydispersiveX-rayspectrometer(EDS)consistingofasemiconductordetector,apre-amplifierandasignalprocessingunitastheessentialparts.ThisInternationalStandardisonlyapplicabletospectrometerswithsemiconductordetectorsoperatingontheprincipleofsolidstateionization.ThisInternationalStandardspecifiesminimumrequirementsforsuchspectrometersattachedtoanelectronprobemicroanalyser(EPMA)orascanningelectronmicroscope(SEM).RealizationoftheanalysisisoutsidethescopeofthisInternationalStandard.
【中国标准分类号】:N50
【国际标准分类号】:71_040_50
【页数】:16P.;A4
【正文语种】:英语
【原文标准名称】:微光束分析.带半导体探测器的能量散射X射线光谱仪的仪器规范
【标准号】:BSISO15632-2002
【标准状态】:作废
【国别】:英国
【发布日期】:2002-12-19
【实施或试行日期】:2002-12-19
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体二极管;半导体探测器;电子束;微量分析;半导体器件;X射线光度法;分析方法;X射线光度计;测量仪器;定义
【英文主题词】:Analysismethods;Definition;Definitions;Electronbeams;Measuringinstruments;Microanalysis;Semiconductordetectors;Semiconductordevices;Semiconductordiodes;X-rayspectrometer;X-rayspectrometry
【摘要】:ThisInternationalStandarddefinesthemostimportantquantitiesthatcharacterizeanenergydispersiveX-rayspectrometer(EDS)consistingofasemiconductordetector,apre-amplifierandasignalprocessingunitastheessentialparts.ThisInternationalStandardisonlyapplicabletospectrometerswithsemiconductordetectorsoperatingontheprincipleofsolidstateionization.ThisInternationalStandardspecifiesminimumrequirementsforsuchspectrometersattachedtoanelectronprobemicroanalyser(EPMA)orascanningelectronmicroscope(SEM).RealizationoftheanalysisisoutsidethescopeofthisInternationalStandard.
【中国标准分类号】:N50
【国际标准分类号】:71_040_50
【页数】:16P.;A4
【正文语种】:英语
下载地址:
点击此处下载